Modular Test Devices

As the greater technology landscape is migrating toward IoT applications and real-time measurements, the necessity of being able to measure much higher speeds with even greater accuracy is growing more important. With low latency and the ability to work and process in parallel, FPGAs and SoCs have proven to be the perfect answer to these measurement needs and enables the engineer to utilize digital signal processing. FPGAs are being used extensively in new instrumentation designs, from general purpose test and measurement products to more application-specific instruments in medical, semiconductor, aerospace, and other industries. By moving the decision making closer to the sensor, or at the “edge” of computing, these measurements can be done in a more responsive way, reducing the overhead demands of a test system.

In Digilent’s newer devices like the ADP3450 and Eclypse, the engineer is able to access Linux straight from the device as a result of the System-on-Chip (SoC) at the core. Both use AMD’s Zynq technology, and give the user the freedom to draw on software expertise in creating the test system, rather than relying solely on manipulating the hardware, or requiring a USB-connected host computer to do the bulk of the data processing.

Zmod Comparison Table